- Ease of adaptation with multiple optical platforms
- Synergy and convenience of combining optical and 3D topographical information in the same place
- Examples of industrial applications that have benefited from the combined platform
- Roughness Measurements, Defect Analysis, Edge Radius, Step Heights
- Material Properties: Hardness, wear analysis, Conductance/Resistance, Magnetism
- Quality Assurance Professionals, Engineers, and Management
- Those interested in non-destructive testing
- Research and Development Teams
- Academic Staff/Students
| Posted: Apr 19th, 2012 | |
Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis |
|
| (Nanowerk News) NanoSurf has announced a free webinar on May 9, 2012 at 11:00 a.m. EDT: "Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis". | |
| The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments. | |
| This webinar will highlight: | |
|
|
|
| Applications: | |
|
|
|
| Who Should Attend: | |
|
|
|
| Register Free at https://www4.gotomeeting.com/register/223072431 | |
| Please retain the following password: Nsf*123. It will be required to join the webinar. |
| Source: NanoSight (press release) |
Translate this article:
Check out these other trending stories on Nanowerk:
|
Subscribe to a free copy of one of our daily |