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Posted: Apr 19, 2012

Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis

(Nanowerk News) NanoSurf has announced a free webinar on May 9, 2012 at 11:00 a.m. EDT: "Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis".
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.
This webinar will highlight:
  • Ease of adaptation with multiple optical platforms
  • Synergy and convenience of combining optical and 3D topographical information in the same place
  • Examples of industrial applications that have benefited from the combined platform
  • Applications:
  • Roughness Measurements, Defect Analysis, Edge Radius, Step Heights
  • Material Properties: Hardness, wear analysis, Conductance/Resistance, Magnetism
  • Who Should Attend:
  • Quality Assurance Professionals, Engineers, and Management
  • Those interested in non-destructive testing
  • Research and Development Teams
  • Academic Staff/Students
  • Please retain the following password: Nsf*123. It will be required to join the webinar.
    Source: NanoSight (press release)
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