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Posted: Apr 19th, 2012
Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis
(Nanowerk News) NanoSurf has announced a free webinar on May 9, 2012 at 11:00 a.m. EDT: "Nanosurf LensAFM Webinar: Advancements in Instrumentation for Surface Inspection and Defect Analysis".
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.
This webinar will highlight:
Ease of adaptation with multiple optical platforms
Synergy and convenience of combining optical and 3D topographical information in the same place
Examples of industrial applications that have benefited from the combined platform