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Posted: May 02, 2012
Nanonics Imaging Hosts User Workshop during CLEO Conference in San Jose, CA
(Nanowerk News) Nanonics Imaging is pleased to invite its current and future customers to an upcoming User Workshop on Tuesday, May 8th from 6:00 – 8:00 pm at the F1 Conference Room in the San Jose Convention Center. The Workshop, to be held during the CLEO 2012 Conference & Exhibition, will feature prominent scientists presenting new developments and research highlights related to their work using Nanonics systems.
The featured speakers are as follows:
Prof. Uriel Levy, Head of the NanoOpto Group, Department of Applied Physics,
the Hebrew University of Jerusalem, will present on New Applications in Nanophotonics, Plasmonics and Optofluidics.
Prof. Nancy Haegel, Distinguished Professor of Physics, the Naval Postgraduate School (NPS) in Monterey, CA, will present on: "Imaging Transport Using Integrated NSOM/AFM in a Scanning Electron Microscope."
Nir Shitrit, PhD Candidate with Prof. Erez Hasman, Micro and Nanooptics Laboratory, Faculty of Mechanical Engineering, the Technion - Israel Institute of Technology, will present on: "Spin-Dependent Plasmonics Based on Interfering Topological Defects."
The workshop is free of charge and open to the public. Light refreshments will be served.
Nanonics will be participating in the CLEO Exhibition at Booth #1227, where they will demonstrate their newest SPM systems including multi-probe AFM & NSOM systems.
About Nanonics Imaging
Nanonics Imaging is a leading global provider of innovative AFM and NSOM systems in the SPM market. Since its inception in 1997, Nanonics has introduced new concepts in system functionality, including our revolutionary approach to NSOM imaging with cantilevered NSOM probes, dual tip/sample scanning AFM systems, Raman/AFM, Multi-probe AFM, and SEM/AFM systems. Nanonics systems are distributed worldwide and are the leading instruments in near-field characterization in plasmonics and photonics. For more information, please visit our website at: www.nanonics.co.il.
Source: Nanonics Imaging (press release)
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