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Posted: November 6, 2007
Credence Expands Analytical Products Portfolio to Help Semiconductor Manufacturers Improve Yields at(...)
(Nanowerk News) Credence Systems (NASDAQ: CMOS), a leading provider of test and analytical solutions from design to production for the worldwide semiconductor industry, today announced major additions to its comprehensive range of integrated analytical tools designed to meet the complex challenges facing manufacturers of today's advanced 65nm, 45nm and beyond device technologies. The expanded product portfolio -- including the Ruby™ laser voltage probing system, the OptiFIB-IV® focused ion-beam (FIB) system, and the significantly enhanced Meridian™ and TriVision™ electrical failure analysis platforms -- will be showcased at the 33rd annual International Symposium for Testing and Failure Analysis (ISTFA 2007, Booth#425) to be held November 4-7 at the McEnery Convention Center, San Jose, California.
"Localization of electrical defects at the 65nm and 45nm technology nodes requires much higher spatial and signal resolution, beyond anything that conventional techniques have been able to offer. The exponential increase in design complexity also makes circuit analysis extremely challenging. All of this is a significant concern for our customers trying to achieve today's stringent time-to-market and profitability goals," said Tameyasu Anayama, general manager of Credence Systems' Diagnostic Group. "The introduction of these leading-edge systems provides our customers with a complete range of integrated analytical tools and capabilities to effectively meet the challenges associated with analyzing the most advanced technologies moving forward."
Accurate Waveform and Timing Measurements
The Ruby™ optical probe system provides accurate waveform and timing measurements of signals switching inside sub-volt devices. The Ruby system is based upon Credence's mature laser voltage probing technology using a revolutionary Polarization Differential Probing (PDP) acquisition scheme. Coupled with a production proven "Point-and-Click" Solid Immersion Lens (SIL), the Ruby system produces exceptionally accurate and low-noise timing waveforms.
Unique Backside Circuit Edit Capability
The OptiFIB-IV® is the latest generation of Credence's innovative coaxial photon ion microscope FIB systems, now capable of quickly editing devices targeted for 45nm process technology and below. The OptiFIB-IV features second-generation copper etch and the industry's best end-point detection capability. The new user-friendly, PC-driven software control interface with integrated FIB Assist™ technology from Fibics Inc. provides unparalleled image quality and unique backside circuit edit capability. By enabling precision milling through the backside of a device, the OptiFIB-IV enhances customers' competitiveness as they tackle 45nm production and 32nm development.
Rapid Transition from Fault Detection to Problem Resolution
The Meridian® electrical failure analysis platform debuts significant enhancements with the release of a new high resolution InGaAs camera and multiple SIL options. A fully integrated, performance-driven platform combining dynamic failure analysis techniques with an emission microscope, laser scanning microscope (LSM) and SIL, Meridian accelerates analysis by helping the failure and product engineers to rapidly move from fault detection to problem resolution on 45nm devices. The innovative "inverted" optics assembly allows direct or cable docking to any tester for facilitating dynamic analysis and for diagnosing wide ranging failure modes, including parametric failures and those resulting from design-process marginalities. The former Meridian "top-down" emission instrument is now available as TriVision™, and is suitable for developers of semiconductor devices who need a cost-effective, versatile electrical failure analysis platform designed to easily scale in step with future technology roadmaps.
All of the new systems are compatible with Credence Systems' NEXS™ Software Suite, which provides an easy-to-use navigation interface while allowing analytical lab equipment users to access common CAD databases. The Ruby™, Meridian®, and OptiFIB®-IV products will be showcased at the Credence Systems' booth (# 425) at ISTFA 2007. Customers can also sign up for a demonstration at www.credence.com/istfa.
Credence Systems Corporation is a leading provider of debug, characterization & ATE solutions for the global semiconductor industry. With a commitment to applying innovative technology to lower the cost-of-test, Credence delivers competitive cost & performance advantages to integrated device manufacturers (IDMs), wafer foundries, outsource assembly & test (OSAT) suppliers & fabless chip companies worldwide. A global, ISO 9001-certified company with a presence in 20 countries, Credence is headquartered in Milpitas, California. More information is available at http://www.credence.com.