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Posted: March 11, 2008

Emerging nanotechnologies to be showcased at the National Institute of Standards and Technology on April 8

(Nanowerk News) Conference to provide insight into NIST s studies of nanoelectronics, nanofabrication and nanometrology.
To aid in the practical application of new innovations and capitalize on technology transfer opportunities, the Maryland Technology Development Corporation (TEDCO), the Tech Council of Maryland/MdBio (TCM/MdBio) and the National Institute of Standards and Technology (NIST) are jointly supporting Opening the Doors to the National Institute of Standards and Technology (NIST): Nanoelectronics, Nanofabrication and Nanometrology. This technology transfer showcase will provide attendees with an inside look at innovations in nanotechnologies developed in NIST laboratories that are available for commercialization. NIST develops timely measurements, standards, and infrastructural technologies that address critical U.S. industry and other government agency needs for innovation and traceable metrology, process control and quality in manufacturing at the nanoscale.
The day-long event will feature:
  • Nanotechnology innovations that are available for commercialization
  • Opportunities for successful partnerships and licensing
  • Poster exhibit sessions and facility tours
  • Reception
  • Who should attend?
  • Entrepreneurs
  • Researchers and inventors
  • Technology executives
  • Regional science, technology and education officials
  • State and local economic and workforce development professionals
  • WHEN
    Tuesday, April 8, 2008 7:30 a.m. to 4 p.m. Reception: 2:30 p.m. to 4 p.m.
    $80 per person

    NIST Main Campus

    Administration Building

    Red Auditorium

    100 Bureau Drive

    Gaithersburg, MD 20899

    For more information about the showcase, please visit or contact Linda Saffer at To register, visit
    Registration deadline for U.S. Citizens is Tuesday, April 1, 2008.
    Registration deadline for Non-U.S. Citizens is Tuesday, March 25, 2008.
    Source: NIST

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