| Posted: May 14, 2008 | |
Workshop: Micro and nanoscale characterization of fibers |
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| (Nanowerk News) Fibers present massive challenges and opportunities for micro and nano technologies. These challenges are not in the manufacturing of the fibers but in the control and understanding of their behavior. | |
| This one-day workshop will focus on the many challenges of fibre analysis at the micro and nano-scale using state-of-the art surface chemical analysis, including SIMS, XPS and SPM techniques. | |
| Topics include fundamental effects of topography in SIMS and XPS, AFM nanomechanics, frictional force microscopy,multivariate analysis and important applications in industry. | |
| This workshop will bring together leading researchers and practical analysts from industry and academia for discussions on the latest developments. Recommendations and guidance for reliable and robust measurements will be presented. The workshop is being held in conjunction with UK Surface Analysis Forum (www.uksaf.org), which will be held at the same venue on the preceding day (Wednesday 2nd July). | |
| Confirmed speakers and topics include: | |
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Using surface analysis to characterise technical textiles |
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Nanofabrication of fi bres and fabrics for technical textiles: the challenges in measurement and characterisation |
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Frictional force microscopy and the nano-analysis of fibers |
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Technical textiles: state of art, measurement issues, and future applications |
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Analysing real-life fiber samples |
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Smart clothes and wearable technology |
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How surface analysis can help in designing new laundry products |
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Analysing hair and skin products using AFM |
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Computer-Assisted Interpretation of TOF-SIMS Data: Fun With Raw Files |
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| Source: National Physical Laboratory |