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Posted: Aug 26, 2008

Keithley Receives 'Best Product Award' for Semiconductor Measurement System

(Nanowerk News) Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, announces that it has been awarded the prestigious Editor's Choice Best Product Award from Semiconductor International magazine for its Model 4200-CVU Semiconductor Measurement System, which is used to make fast and easy C-V (Capacitance-Voltage) measurements. The annual awards "find and reward the products created by companies that deliver the level of excellence needed to succeed" in the semiconductor industry, according to the magazine.
"C-V measurements are becoming a critical part of research and development in the semiconductor industry," said Mark Hoersten, Keithley vice president business development. "Keithley's Model 4200-CVU is a fast and easy measurement instrument that is vital for product developers and researchers facing the challenges of characterizing new semiconductor materials for next-generation electronic devices such as smart phones, laptops, and other electronic devices."
The awards were presented at a special ceremony on July 16th during the SEMICON West trade show in San Francisco.
For More Information. For more information on Keithley's Model 4200-CVU or any of its semiconductor test systems, visit or contact the company at
Source: Keithley Instruments (press release)
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