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Posted: February 5, 2009
Asylum Research sponsors free AFM workshop at Georgia Tech Feb. 12-13
(Nanowerk News) Asylum Research will sponsor a free atomic force microscopy (AFM) Workshop on February 12 and 13, 2009 in the Pettit Building/Microelectronics Research Center (MiRC) on the Georgia Institute of Technology (Georgia Tech) campus.
The Workshop will include three keynote talks by Georgia Tech researchers on Nanogenerators (Dr. Jinhui Song), on Heterogeneous Lipoprotein Assembly and Structure (Dr. Todd Shulchek), and on Microgels on Surfaces (Dr. Toni South). Asylum Research scientists Dr. Nick Geisse and Keith Jones will speak on AFM instrument technology and combined AFM and Optical Imaging.
The first day of the workshop will include the talks described above, as well as an afternoon AFM demonstration session on the MFP-3D-BIO™ AFM. The second day of the workshop will continue with in-depth AFM applications demonstrations. Lunch will be provided on the 12th.
The Workshop is open to all researchers and students; seating is limited and all attendees must pre-register. Full details on the workshop, as well as online registration information, can be found at www.asylumresearch.com/GaTech/.
About Asylum Research
Asylum Research is the technology leader for atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Started by former employees of Digital Instruments in 1999, Asylum is dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 200 years combined AFM/SPM experience from our scientists, engineers and software developers. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more.
Asylumís product line offers advanced imaging and measurement capabilities for a wide range of samples, including Dual AC™ mode, iDrive,™ Q-control, electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylumís MFP-3D, set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes.
Asylumís new Cypher AFM is the first completely new small sample AFM/SPM in over a decade, and sets the new standard as the worldís highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.