| Posted: March 10, 2009 |
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LogicVision Announces Memory BIST and Repair Solutions for 45nm SOI Foundry Customers
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(Nanowerk News) LogicVision, Inc., a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that IBM Corporation has included LogicVision's ETMemory™ memory BIST and on-chip self-repair solution for embedded memory test and yield improvement within its advanced 45nm silicon-on-insulator (SOI) semiconductor foundry flow. The ETMemory solution will be recommended by IBM to its 45nm SOI customers to assist them in performing their own design work.
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LogicVision's ETMemory solution provides a comprehensive, integrated and low area overhead solution for at-speed test and repair of embedded memories. The solution provides automation for integrating and verifying embedded memory test and repair capabilities which not only provide a high quality manufacturing test solution, but also deliver yield improvement through on-chip memory repair analysis and eFuse management.
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"In 45nm designs, memory takes up a large portion of the die and, therefore, has a large impact on quality and yield," said Regina Darmoni, Director, Analog/Mixed Signal & Digital Foundry, IBM. "The memory test and repair capabilities provided by LogicVision's ETMemory product will assist our foundry customers in achieving their overall quality and yield objectives."
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"We continue to see increasing adoption of our solutions at the deeper technology nodes," said Jim Healy, president and CEO of LogicVision. "Having a technology leader such as IBM adopt some of our key products not only serves as a powerful endorsement, but helps ensure we maintain our competitive edge as we continue to meet their leading edge technology needs."
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