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Posted: March 10, 2009

LogicVision Announces Memory BIST and Repair Solutions for 45nm SOI Foundry Customers

(Nanowerk News) LogicVision, Inc., a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that IBM Corporation has included LogicVision's ETMemory™ memory BIST and on-chip self-repair solution for embedded memory test and yield improvement within its advanced 45nm silicon-on-insulator (SOI) semiconductor foundry flow. The ETMemory solution will be recommended by IBM to its 45nm SOI customers to assist them in performing their own design work.
LogicVision's ETMemory solution provides a comprehensive, integrated and low area overhead solution for at-speed test and repair of embedded memories. The solution provides automation for integrating and verifying embedded memory test and repair capabilities which not only provide a high quality manufacturing test solution, but also deliver yield improvement through on-chip memory repair analysis and eFuse management.
"In 45nm designs, memory takes up a large portion of the die and, therefore, has a large impact on quality and yield," said Regina Darmoni, Director, Analog/Mixed Signal & Digital Foundry, IBM. "The memory test and repair capabilities provided by LogicVision's ETMemory product will assist our foundry customers in achieving their overall quality and yield objectives."
"We continue to see increasing adoption of our solutions at the deeper technology nodes," said Jim Healy, president and CEO of LogicVision. "Having a technology leader such as IBM adopt some of our key products not only serves as a powerful endorsement, but helps ensure we maintain our competitive edge as we continue to meet their leading edge technology needs."
Source: LogicVision (press release)