| Posted: March 20, 2009 |
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New Chemometric Software for Raman Spectral and Microscopic Data Analysis
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(Nanowerk News) WITec, a manufacturer of high-resolution Optical and Scanning Probe Microscopy solutions,
has introduced the WITec Project Plus software package for advanced data evaluation and
chemometric image processing. It features various tools for multivariate data analysis in the
fields of Confocal Raman Imaging and Scanning Probe Microscopy such as cluster analysis
and principal component analysis. Thus, hidden structures in the images can be visualized
automatically, leading to quick and consistent interpretation of the data. Additionally, a variety
of advanced patent-pending analysis tools and algorithms enable comprehensive and userfriendly
computerized data evaluation and image generation.
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The speed with which the
extensive calculations behind the various algorithms and procedures can be executed is
unprecedented and provides a new level of capability in analysis operations. WITec Project
Plus can be obtained as an add-on software package for the WITec Project data evaluation
software.
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“With WITec Project Plus we provide another software module for unparalleled and
unmatched chemical, structural, and optical imaging at the highest resolution. It ideally
supports WITec’s philosophy of delivering a single software environment for a variety of
microscopic techniques, measurement modes and microscope models” says Dr. Joachim
Koenen, Managing Director at WITec. “Due to the uniqueness of the algorithms and features
developed, it was clear that patent applications were filed in order to secure WITec’s toplevel
expertise at the forefront of hyperspectral Raman Imaging.”
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In Confocal Raman Imaging a complete Raman Spectrum is acquired at each image pixel
resulting in images consisting of tens of thousands of spectra. The WITec microscope series
additionally allows the combination of Raman imaging with Atomic Force Microscopy for a
more comprehensive investigation of a sample. A sophisticated software package is
essential for successful data evaluation and post-processing. WITec Control for instrument
and measurement control and the WITec Project package provide a software environment
from one source for the various microscopic techniques, measurement modes and
microscope models.
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About WITec
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WITec is a manufacturer of high performance optical and scanning probe microscopy
systems. A modular product line allows the combination of different microscopy techniques
such as Raman, SNOM or AFM in a single instrument for flexible analysis of the optical,
chemical and structural properties of a sample. The instruments are distributed worldwide
and are used primarily in the fields of Materials Science, Life Science and Nanotechnology.
WITec is based in Ulm, Germany and Savoy, IL, USA. For more information, please visit
http://www.witec.de.
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