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Posted: Jul 30, 2012

EDAX Introduces Octane Series SDDs for Fast, High-Quality EDS Microanalysis

(Nanowerk News) EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the new Octane Series Silicon Drift Detectors (SDD) for its TEAM™ EDS Analysis Systems on electron microscopes.
By incorporating the latest advancements in Silicon Drift Detector technology, the Octane SDD family delivers high-quality EDS data at previously unachievable speeds. Until now, the potential speed advantages of SDD technology have been unrealized due to losses in data quality at high count rates.
With the Octane Series, customers are no longer forced to choose between fast data collection and high-quality results. They can now benefit from both to maximize their materials insight.
The Octane Series includes four models—the Pro, Plus, Super and Ultra—that are designed specifically to meet the demands of key microanalysis applications. At the core of the Octane family is an advanced spectrometer design and state-of-the-art electronics that enable energy resolution down to 121 eV with world-class efficiency in converting input counts into stored data.
When compared with typical systems on the market, the new design provides a stable energy resolution at high collection speeds. This resolution stability translates into higher-quality data at high input count rates.
Pairing the new SDD technology with EDAX’s TEAM™ EDS software allows users to take advantage of the Smart Features in TEAM™ Systems to optimize their analysis time and get the best data possible from their sample. In addition to Smart Quant and EXpert ID, the Smart Pulse Pile-Up Correction feature minimizes concerns typical of high count rate collections and allows maximum use of SDD technology.
TEAM™ EDS Analysis Systems with Octane SDDs deliver on the full promise of SDD technology – high-speed analysis with no sacrifice in the quality of the data.
“At EDAX, we believe that users should not have to compromise in their efforts to understand their materials. Extraction of high-resolution quantitative analysis is now possible from a map collected at 200,000 counts per second,” comments Mike Coy, Technical Product Manager for Microanalysis at EDAX. “The ability to collect X-rays faster while maintaining the quality of underlying data allows our users to focus more of their valuable time on new materials discoveries.”
The Octane Series SDD delivers performance without compromise to users across a wide variety of applications. By ensuring high-quality data even at high data collection rates, TEAM™ EDS Analysis Systems with Octane SDDs provide customers valuable time savings that can be spent on solving other pressing materials challenges.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of more than $3.0 billion.
Source: TMC (press release)

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