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Posted: Oct 26th, 2012
Attolight and Leti Launch Joint-Development Program to Extend Applications for Cathodoluminescence Technology
(Nanowerk News) Attolight and CEA-Leti today announced that they have entered into a joint-development program to apply Attolight’s cathodoluminescence microscopy to semiconductor materials.
Attolight’s innovative combination of electron and light microscopy reveals ultra-trace impurities and crystallographic defects not visible using other imaging techniques. The company’s core expertise is a measurement technique called cathodoluminescence, a non-destructive characterization method yielding a level of data that provides a deeper understanding of material structures and properties. The program with Leti is designed to extend the technology for use in the chip industry and research applications.
“This joint-development program with CEA-Leti is a major milestone for Attolight. It is a clear indicator of the value of Attolight’s innovative technology for state-of-the-art research in a variety of applications,” said Attolight CEO Samuel Sonderegger. “We are very proud to collaborate with such a prestigious partner and this development clearly endorses the quality of Attolight’s products.”
”Our integrated cathodoluminescence approach opens new areas of investigation for research and development teams. For the first time in the marketplace, Attolight’s non-destructive methodology generates quantitative high-resolution cathodoluminescence data for advanced material research,” said Olivier Gougeon, Attolight’s vice president of sales and marketing. “This joint development program will accelerate the build up of Attolight’s product portfolio and will support the company’s global strategy to provide innovative characterization tools, services and technical expertise to the semiconductor industry and research laboratories.”
“The introduction of the cathodoluminescence microscopy in our portfolio of advanced characterization techniques is in line with our roadmaps, and made possible thanks to the French RTB program,” said Narciso Gambacorti, Leti’s nanocharacterization program manager. “This new equipment will complete the unique offer in terms of material analysis already available in the world-class nanocharacterization platform (PFNC) present at the MINATEC campus. Attolight’s experience in the field of material analysis and cathodoluminescence, in particular, will significantly accelerate the introduction of this technique at Leti.”
Leti is an institute of CEA, a French research-and-technology organization with activities in energy, IT, healthcare, defence and security. Leti is focused on creating value and innovation through technology transfer to its industrial partners. It specializes in nanotechnologies and their applications, from wireless devices and systems, to biology, healthcare and photonics. NEMS and MEMS are at the core of its activities. An anchor of the MINATEC campus, CEA-Leti operates 8,000-m˛ of state-of-the-art clean room space on 200mm and 300mm wafer platforms. It employs 1,700 scientists and engineers including 240 Ph.D. students and 200 assignees from partner companies. CEA-Leti owns more than 1,880 patent families.
For more information, visit www.leti.fr.
Attolight AG is a Swiss startup company developing innovative characterization tools and solutions for research laboratories and the semiconductor industry. Attolight’s innovative combination of electron and light microscopy reveals ultra-trace impurities and crystallographic defects not visible using other imaging techniques. The core expertise of Attolight is a measurement technique called cathodoluminescence, a non-destructive characterization method yielding a level of data that provides a deeper understanding of material structures and properties. Attolight addresses a variety of applications: LED performance and reliability, GaN power transistors, deep UV emitters, solar cell efficiency, plasmonics, geology, and biosensors. Attolight invented and launched the first quantitative cathodoluminescence system in 2011 offering a spatial resolution below 10nm, a field of view of 300µm, and an optional 10ps time resolution mode. Attolight also has laboratory facilities and testing capabilities available for contract service measurements. www.attolight.com