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Posted: Feb 28, 2013
Free Webinar to Learn More About the Breaking Technologies at Park Systems
(Nanowerk News) Park Systems invites yout to two interactive Park AFM webinar sessions to learn more about the breaking technologies at Park Systems.
The webinar will cover two topics:
Part 1. Park NX20: The Most Accurate AFM for Failure Analysis (FA) & Quality Assurance (QA)
Part 2. Live Single Cell Imaging with Park Scanning Probe Microscopy
The first session will walk you through the next generation AFM advances in Park NX20, talk to you about our Park nano technology solution to your application needs, and show you an overview of the technology behind Park NX20.
The second session will cover the technology of single live cell imaging with Park scanning probe microscopy.
Do not miss these great opportunities to meet the technical experts from Park during the webinar session. At the end of the presentation, you will have an opportunity to ask questions you may have specific to your application.
Wednesday, March 20
China 1:00 PM - 1:30 PM (CST)*
Americas 4:00 PM - 4:30 PM (EDT)*
Thursday, March 21
Asia 11:30 AM - 12:30 PM (IST)
Japan 4:00 PM - 4:30 PM (JST)*
Europe 1:00 PM - 2:00 PM (GMT)
* China, Americas, and Japan: Part 1. Park NX20 session will be presented only
Upon your registration, you will receive a confirmation email with the login details.
PC-based attendees – Required: Windows® 7, Vista, XP or 2003 Server
Macintosh®-based attendees – Required: Mac OS® X 10.5 or newer
For any questions, please contact sj.kim@parkAFM.com
Source: Park Systems (press release)
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