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Posted: Feb 28, 2013

Free Webinar to Learn More About the Breaking Technologies at Park Systems

(Nanowerk News) Park Systems invites yout to two interactive Park AFM webinar sessions to learn more about the breaking technologies at Park Systems.
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The webinar will cover two topics:

Part 1. Park NX20: The Most Accurate AFM for Failure Analysis (FA) & Quality Assurance (QA)

Part 2. Live Single Cell Imaging with Park Scanning Probe Microscopy

The first session will walk you through the next generation AFM advances in Park NX20, talk to you about our Park nano technology solution to your application needs, and show you an overview of the technology behind Park NX20.

The second session will cover the technology of single live cell imaging with Park scanning probe microscopy.

Do not miss these great opportunities to meet the technical experts from Park during the webinar session. At the end of the presentation, you will have an opportunity to ask questions you may have specific to your application.
afm images
Wednesday, March 20
  • China 1:00 PM - 1:30 PM (CST)*
  • Americas 4:00 PM - 4:30 PM (EDT)*
  • Thursday, March 21
  • Asia 11:30 AM - 12:30 PM (IST)
  • Japan 4:00 PM - 4:30 PM (JST)*
  • Europe 1:00 PM - 2:00 PM (GMT)
  • * China, Americas, and Japan: Part 1. Park NX20 session will be presented only
    Upon your registration, you will receive a confirmation email with the login details.
    System Requirements
    PC-based attendees – Required: Windows® 7, Vista, XP or 2003 Server
    Macintosh®-based attendees – Required: Mac OS® X 10.5 or newer
    For any questions, please contact sj.kim@parkAFM.com
    Source: Park Systems (press release)
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