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Posted: Mar 21, 2013
Advanced thin film transistors enable world's largest flexible X-ray detector
(Nanowerk News) The Flexible Electronics and Display Center at Arizona State University (formerly the Flexible Display Center) and PARC, a Xerox company, announced that they successfully manufactured the world's largest flexible X-ray detector prototype using advanced thin film transistors.
Measuring 7.9 diagonal inches, the device was jointly developed at the center and PARC in conjunction with the Army Research Lab and the Defense Threat Reduction Agency. This device will be used to advance the development of flexible X-ray detectors for use in thin, lightweight, conformable and highly rugged devices.
The Flexible Electronics and Display Center at Arizona State University and PARC, a Xerox company, announced that they successfully manufactured the world's largest flexible X-ray detector prototype using advanced thin film transistors. (Photo: PARC)
The thin film transistors and PIN diode processing was done on the 470mm by 370 mm Gen II line at the Flexible Electronics and Display Center. This device showcases the center's successful scale up to GEN II, and the ability to produce sensors and displays using thin film transistors in standard process flows with the center's proprietary bond/de-bond technology.
The system design and integration was done at PARC. The flexible X-ray sensor was coupled to a flexible electrophoretic display and electronics to provide a self-contained, direct-view unit (including battery, user-interface and software). This system shows PARC's capability to build user-defined prototype systems incorporating novel device physics, materials and technology. PARC has extensive experience in building large-area electronic systems, display and backplane prototypes, and organic and printed electronics.