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Posted: Apr 05, 2013
SPECTRO Introduces Advanced OES Technology for More Accurate Carbon Analysis in Cast Iron
(Nanowerk News) SPECTRO Analytical Instruments has introduced optical emission spectrometry (OES) technology that offers greater carbon measurement accuracy and speed in cast iron production applications. The technology debuts at the Cast Expo and Metal Casting Congress, April 6-9, 2013, in St. Louis.
“Our new analytical solution combines the performance of the traditional combustion analyzer with the speed and ease-of-use of OES methodology,“ comments Kay Toedter , SPECTRO Product Manager SMA, “Now incorporated in our SPECTROLAB and SPECTROMAXx systems, this new approach precisely determines carbon in cast iron, even on suboptimal samples, with results comparable to those achieved with the time- and money-consuming combustion analysis technique.”
“A new analytical carbon line and a related reference line, in combination with a modified read-out sequence, enable the detection of free graphite during the pre-burn phase. This in turn ensures accurate carbon results for many more samples than before. Samples with an unacceptably high amount of free graphite are identified as ‘bad” samples’,” notes Kay Toedter.
SPECTROLAB Optical Emission Spectrometer.
Better Technology for Superior Performance
SPECTRO’s advanced OES analysis technology excels across the key requirements for superior carbon measurement performance.
Digitally controlled plasma generator: For the first time in OES history, the SPECTROMAXx and SPECTROLAB plasma generators are fully digitally controlled for more accurate and reproducible spark definition. This allows the instrument to deliver greater precision, better repeatability, faster measurement with less impact from external interference.
Greater UV performance: SPECTROLAB’s unique UV-PLUS system contains a hermetically sealed opti¬cal chamber that is filled just once with argon. Impurities are removed through a built-in filter cartridge, reducing operating costs and extending maintenance intervals.
Higher optical resolution: The SPECTROMAXx is equipped exclusively with CCD technology for users who don’t need the higher sensitivity and shorter reaction time of photomultiplier detection (PMT). For those requiring ultra trace analysis and time-dependent spark examination, the SPECTROLAB combines both CCD and PMT technologies in a single, powerful instrument.
Sophisticated data processing: The SPECTROLAB and SPECTROMAXx systems enable complete coverage of the entire spectrum relevant for cast iron analysis. In addition to outputting results for individual elements, the data can be sorted according to measurement or configuration, or read out as a complete wavelength scan. SPECTROLAB’s PMT signal can be outputted with microsecond resolution, allowing individual sparks to be broken into a hundred or more steps.
The SPECTROLAB and SPECTROMAXx system applications for cast iron carbon analyses are immediately available. For more information, visit SPECTRO at www.spectro.com
SPECTRO is one of the world’s leading suppliers of analytical instruments for optical emission and X-ray fluorescence spectrometry. As a unit of the AMETEK Materials Analysis Division, SPECTRO manufactures advanced instruments, develops the best solutions for strongly varying applications and provides exemplary customer service. SPECTRO’s products are exemplified by unique technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.
AMETEK Materials Analysis Division is a division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electromechanical products with nearly 14,000 employees at over 120 operating facilities and more than 80 sales and service centers across the United States and in nearly 30 other countries around the world.
Please contact Tom Milner for additional information, Tel: +49 / 28 21 / 8 92-0, Fax: +49 / 28 21/ 8 92-22 00, E-Mail: email@example.com
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