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Posted: Jul 23, 2013

LayTec's Metrology System X Link Wins Intersolar Award 2013

(Nanowerk News) LayTec in-line GmbH has won this year’s Intersolar AWARD in the category “PV Production Technologies“ for X Link – a revolutionary metrology system for non-destructive evaluation of the EVA (ethylene vinyl acetate) cross-linking level immediately after lamination. Every year, the North America Intersolar Jury recognizes the best of the best in solar projects and photovoltaic (PV) production technologies. The winners in the PV Production Technologies category were judged on the degree of technological innovation, technical and environmental benefits, economic benefits and proof of innovation.
LayTec’s X Link was developed in collaboration with the leading applied research organization Fraunhofer USA and is the only non-destructive system available today for the inspection of EVA cross-linking. The tool can be integrated into every solar module production line and provides for long-term process stability, high yields, 100 % quality and low production costs. The AWARD was announced on 10 July at the Intersolar North America exhibition and conference in San Francisco. According to Intersolar event coordinators, the introduction of the PV Production Technology category is a nod to the region’s reputation as the epicenter for the semiconductor industry and related technologies. For further information please contact mail@laytec.de or visit www.intersolar.us/en/news-north-america/intersolar-news.html
LayTec develops and manufactures integrated in-situ and in-line metrology for thin-film deposition and other high value generating processes. Currently, the company has more than 1600 metrology systems installed worldwide and offers a global customer support and service network including local representations.
Source: LayTec (press release)
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