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Posted: Aug 01, 2013
Leica Microsystems Launches High-Precision Scanning Stage for Stereo Microscopes and Macroscopes
(Nanowerk News) Leica Microsystems launches a high-precision scanning stage for stereo microscopes and macroscopes, the Leica LMT260 XY Scanning Stage. To ensure successful experiments, it offers a repeatability of 0.25 µm for samples weighing less than 0.5 kg, and of 1 µm for heavier loads of 1.5 kg. This repeatability is reached at a resolution of 5 nm. Such precision is especially interesting for users who perform time-lapse experiments such as mark and find, or multi-well screenings.
Working with highest precision: Leica M205 FA with transmitted light base Leica TL5000 Ergo und Leica LMT260 XY Scanning Stage.
"We know that every micrometer counts when imaging several samples at different XY positions", says Dr. Björn Fuchs, Product Manager, Leica Microsystems. "The Leica LMT260 XY Scanning Stage is ideal for time-lapse experiments, but also when it comes to scanning large areas with high magnification. After the software has divided the sample into a grid, the stage moves along this grid to the points of interest." The software modules Multistep of Leica Application Suite (LAS) or Tile Scan of LAS Advanced Fluorescence then create a high-resolution picture from the several images the camera takes.
To produce accurate and reproducible results with stereo microscopes, the Leica LMT260 XY Scanning Stage uses a magneto-resistive measurement system and two linear motors. The motors move the stage swiftly and quietly, but users can also move the stage manually any time. Due to absolute measurements, users will not need to reference after initializing the stage and may concentrate on their work.
Technical data are available for download: http://www.leica-microsystems.com/products/stereo-microscopes-macroscopes/accessories/details/product/leica-lmt260-xy-scanning-stage/downloads/