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Posted: Oct 03, 2013
A new method to diagnose nanoelectronic components
(Nanowerk News) Researchers at the University of Maryland have developed a new method to examine
the electric potential distribution of a prototype single-carbon-nanotube device consisting of a suspended carbon nanotube (CNT) with source and drain electrodes, using off-axis EH and finite element calculations.
Using this method, it is possible to quickly debug a localized connection failure and detect latent misbehavior on the real device level with a spatial resolution of 10 nm or less.
Moreover, the method makes use of a direct and real-space measurement of the electrostatic potential without reliance upon a metallic physical probe that may be susceptible to variations in the local work function.
This approach can be broadly applicable to understanding and diagnosing a variety of nanodevices based on many other nanostructures, such as silicon nanowires and graphene.