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LVEM5 Benchtop Electron Microscope on Display at ICONN 2012

Delong America is pleased to announce that we will have the LVEM5 benchtop electron microscope on display at the 10th Asia-Pacific Microscopy Conference (APMC 10), the 2012 International Conference on Nanoscience and Nanotechnology (ICONN 2012) and the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 22).

Posted: Jan 10th, 2012

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FEI Buys ASPEX Corporation

FEI, a leading instrumentation company providing imaging and analysis systems for research and industry, today announced that it has acquired ASPEX Corporation of Delmont, PA. ASPEX provides rugged scanning electron microscopes (SEMs) and related services for environmentally demanding military, industrial and factory floor applications.

Posted: Jan 9th, 2012

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