Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices - The 20/20 XL? From CRAIC Technologies
The 20/20 XL is designed to work with large scale samples, such as 300 mm wafers, to measure thin film thickness as well as the Raman spectra of microscopic sampling areas. The 20/20 XL also offers UV microscopy, a full spectroscopy suite as well as either manual or automated operation.
Posted: Jul 4th, 2011Read more