The 308 PV spectrophotometer is designed for colorimetry and spectroscopy of even sub-micron-sized features. It attaches to a microscope or probe station to yield spectra and colorimetric data quickly and easily.
Samsung Electronics Co., Ltd., a world leader in advanced memory technology, today announced that it is the first in the industry to start mass producing 32 gigabyte memory modules, essential for cloud computing and advanced server systems, using 30 nanometer class four gigabit (Gb) DDR3 DRAM chips.
FPInnovations has announced today's inauguration of its new NanoCrystalline Cellulose (NCC) research facilities, which consist of a state-of-the-art pilot plant, new high-performance equipment for the Quebec City laboratory and two new research laboratories located at Pointe-Claire.
NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM). NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed scanning.
BASF is entering the business of electrolytes for lithium-ion batteries (LIB) and is forming a global electrolytes team in its Intermediates division for this purpose. By adding electrolytes to its existing portfolio for the LIB industry, BASF is able to offer another key component for the battery technology.
Oxford Instruments Magnetic Resonance (OIMR) and Green Imaging Technologies, Inc. (GIT) have announced an agreement to establish a strategic partnership to bring complete cutting edge Nuclear Magnetic Resonance (NMR) solutions to the core analysis community.
This Memorial Day weekend at the 2011 Annual ACA Meeting, Bruker will launch a new series of high-performance X-ray crystallography systems, including the D8 QUEST and the D8 VENTURE. Both systems incorporate next-generation X-ray source and novel detector technology to deliver unrivalled performance, ease of use, reliability and value.
PearL is part of the LayTec product line for solar applications. It is an optical in-line monitoring system, measuring photoluminescence spectra of thin-film modules in production lines. The system is designed for measuring in CIGS based production lines.
Camtek Ltd. today announced that it has received repeat orders for Automatic Optical Inspection (AOI) systems. The application is advanced Micro Bump inspection and metrology from a leading foundry based in Asia.
SPP Process Technology Systems, a leading manufacturer of plasma etch and deposition, and thermal processing equipment for the semiconductor and related industries, and Griffith University in Australia today announced a joint development agreement targeting the commercialization of Silicon Carbide on Silicon technology. SiC on Si substrates have a wide variety of applications for the rapidly growing light-emitting diode (LED), micro-electro-mechanical systems (MEMS) and Power markets.
Altera joins a growing number of fabless semiconductor companies that are part of imec's INSITE program, which provides member companies insight into near-term and future IC technology options. The initial collaboration between imec and Altera will focus on the development of 3-D process technologies targeting Altera's product families.
Building on its commitment to advance technology through materials science, Aldrich Materials Science, a strategic growth initiative of Sigma-Aldrich Corporation, announced the establishment of a permanent endowment through the Materials Research Society (MRS) to support the new Mid-Career Researcher Award.
Dolomite, a world leader in microfluidic design and manufacture, has launched a new range of Piezoelectric Pumps providing a flexible solution for handling small volumes of fluid within microfluidic systems.
The world's leading mass imaging equipment supplier, DEK International, was conferred a total of five leading industry awards at NEPCON China 2011 for its outstanding product performance and innovative solutions applicable to electronics assembly.