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Olympus LEXT OLS4000 Becomes Reference for Imaging Confocal Microscopy in Metrology

The Olympus LEXT OLS4000 is being used as a benchmark tool for the development of good practice guidelines and new reference standards in optical metrology. With both of these projects being detailed at the upcoming 13th International Conference on Metrology and Properties of Engineering Surfaces, hosted by the National Physics Laboratory (NPL) at Twickenham Stadium, Olympus is at the forefront of developments in metrology.

Posted: Apr 11th, 2011

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Avto Metals Receives Patent for Quantum Transistor

Avto Metals plc has received a U.S. patent for a new type of quantum transistor that could make possible smaller, more powerful electronic devices of all sorts. The technology uses a recently-discovered quantum interference effect that will enable transformation of existing materials into materials with precisely-defined properties for almost any electronic application.

Posted: Apr 7th, 2011

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Nanosolar Announces New Efficiency Benchmarks and Industry Partnerships

Thin film solar innovation leader Nanosolar, Inc. announced new efficiency benchmarks of 11.6 percent for the Nanosolar Utility Panel and 13.9 percent for its printed CIGS (Copper, Indium, Gallium, Selenium) solar cells, as measured by the Fraunhofer Institute for Solar Energy (ISE) and the National Renewable Energy Laboratory (NREL).

Posted: Apr 7th, 2011

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