Under the terms of the partnership, Accelrys and Oxford Nanopore will develop software to enable complex, real-time analyses of experimental data produced by the Oxford Nanopore single molecule analysis system.
mPhase Technologies, Inc. today announced that it has entered preliminary discussions with a major prime contractor of military and commercial products for a joint project to custom tailor its Smart Nanobattery to a major application.
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the work from the Light Technology Institute at the Karlsruhe Institute of Technology (KIT) in Germany where the JPK NanoWizard family of AFMs provide the backbone for topographic and optical research activities.
Abakan Inc. announced today that MesoCoat, Inc., a portfolio company, along with their partner University of Akron (UA) have received a $2 million award from Ohio Third Frontier under the Advanced Energy Program to accelerate the commercial demonstration of CermaClad, a high speed fusion cladding process, and development and qualification of CermaClad nanocomposite ceramic metallic (cermet) materials, along with Ceramers being developed at UA for advanced energy and infrastructure applications.
The company concluded a patent license agreement for the use of these materials with U.S. based company Hyperion Catalysis International, Inc. The agreement will help to solidify the leading positions of both companies in research and development as well as production technology for high-quality CNT-based products.
Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy, has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher and MFP-3D AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy technique capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level.
Excelitas' newest UV-enhanced SPCM, with peak sensitivity in the 400-500 nm range, is ideal for fluorescence detection, confocal microscopy, single molecule detection, and other photon counting applications.
Industrial Nanotech, Inc. today announced that the Company is starting multiple pilot projects with hospitals and universities throughout the U.S. to increase the efficiency of their steam processes through use of the Company's patented Nansulate thermal insulation and corrosion prevention coatings.
KLA-Tencor Corporation, the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the newest addition to its Component Inspector series, the ICOS CI-T620 - a high-performance component inspector system for tape and reel.
The IonFlux system will enable detailed studies of nanoparticle membrane disruption, a novel application for automated patch clamp instruments that are typically used for the characterization of ion channel modulators.
Camtek Ltd. announced today that a leading Asian Semiconductor Manufacturer has selected the Xact, Camtek's Advanced TEM (Transmission Electron Microscope) sample preparation solution, enabling material analysis and verification.
Thermo Fisher Scientific Inc. today announced the release of the Thermo Scientific EASY-Column for nanoscale HPLC applications. Nanoscale HPLC is primarily used in combination with high performance mass spectrometry for the analysis of complex biological samples, such as applications in proteomics and disease biomarker discovery.
NanoSight, world-leading manufacturers of unique nanoparticle characterization technology announce the release of Zeta Potential Analysis applying Z-NTA, particle by particle characterization of surface charge.