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Asylum Research Introduces Electrochemical Strain Microscopy for Energy Storage Research

Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy, has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher and MFP-3D AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy technique capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level.

Mar 15th, 2011

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KLA-Tencor Introduces the ICOS CI-T620 Packaged IC Component Inspector

KLA-Tencor Corporation, the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the newest addition to its Component Inspector series, the ICOS CI-T620 - a high-performance component inspector system for tape and reel.

Mar 15th, 2011

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Bruker Announces New High-Performance Scientific Instruments and Analytical Solutions for Life-Science Research, Industrial and Applied Markets at Pittcon 2011

At Pittcon 2011, Bruker is announcing its latest product innovations and is showcasing its expanding portfolio of analytical technologies. The new systems deliver more sensitivity, productivity and specificity for confident analysis in industrial and applied markets, and open new horizons for advanced molecular and materials research applications.

Mar 14th, 2011

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