A123 Systems, a developer and manufacturer of advanced Nanophosphate lithium ion batteries and systems, today announced it has received TS 16949 certification which validates that A123's product design and manufacturing processes meet the highest standards for excellence in the automotive industry.
Cadence Design Systems, Inc., a leader in global electronic design innovation, today announced that STMicroelectronics, a global leader in integrated circuits for communications, consumer, computer, automotive and industrial applications, has standardized on Cadence QRC Extraction for their 40-nanometer custom/analog designs.
Anasys Instruments is pleased to announce that their nanoIR platform, a powerful new measurement tool that reveals the chemical composition of samples at the nanoscale, has been selected to receive a prestigious R+D 100 Award.
A new HemiPleat Nano dust collector filter from Camfil Farr Air Pollution Control offers higher filtration efficiencies, longer service life, and lower pressure drop than competitive nano fiber filters, for energy savings and enhanced performance.
Advanced Diamond Technologies (ADT) received a Phase I Small Business Innovation Research (SBIR) grant from the National Science Foundation (NSF) to develop the next generation of chemical mechanical planarization (CMP) pad conditioners for the semiconductor industry.
Microfluidics, the exclusive developer of scalable Microfluidizer high shear fluid processors for uniform particle size reduction, robust cell disruption and bottom-up nanoparticle creation, offers professional Proof of Concept testing for pharmaceutical, biotechnology, chemical, energy, cosmetic and nutraceutical/food companies worldwide interested in leveraging the benefits of nanomaterials.
Vorbeck Materials Corp., in collaboration with the Pacific Northwest National Laboratory (PNNL), operated by Battelle for the Department of Energy, announces a cooperative research and development agreement (CRADA) to develop Li-ion battery electrodes using Vorbeck's unique graphene material, Vor-x.
Jordan Valley Semiconductors Ltd. (JVS), a leading provider of X-ray-based semiconductor in-line metrology tools, announced today the launch of its new JVX7200, which targets the challenging SiGe in-line process monitoring.
Asylum Research, Oak Ridge National Laboratory (ORNL), and R+D Magazine have announced that the new Ztherm Modulated Local Thermal Analysis Option for Asylum's MFP-3D and Cypher Atomic Force Microscopes has been awarded the R+D100 Award for 2010.