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Applied Nanotech Receives MDB Capital Award

Applied Nanotech Holdings, Inc. announced that it received an ASTRUM award at MDB Capital Group's 2010 Bright Lights Conference, the first public company conference focused exclusively on companies with disruptive and market changing intellectual property.

Posted: May 25th, 2010

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BrightView's In-line Metrology Solution Adopted by T-Solar

The tool will be utilized for capturing and analyzing process maps for 100% of the produced panels, a method that will dramatically enhance productivity, drive product improvements enable novel process optimization solutions that improve long term reliability and project bankability.

Posted: May 25th, 2010

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OptimalTest to Provide STMicroelectronics with Advanced Adaptive Test Solutions for Enhanced Test Operations

OptimalTest, a leader in Advanced Adaptive Test and enterprise-wide test management and optimization software for the semiconductor industry, has entered into a licensing agreement with STMicroelectronics to provide solutions for test floor monitoring and control, including early detection of issues, for the semiconductor company's distributed test operations.

Posted: May 24th, 2010

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