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Spectral Surface Mapping with Microscopic Resolution

CRAIC Technologies introduces Spectral Surface Mapping software. This gives a user the ability to map the UV-visible-NIR absorbance, reflectance or fluorescence spectral response, point-by-point, with microscopic spatial resolution.

Apr 29th, 2014

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Park Systems Introduces Automatic Defect Review for Semiconductor Wafers - An Astounding 1,000% Throughput Increase

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers.

Apr 3rd, 2014

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CVD Selling up to 300 mm CVD Graphene

CVD Equipment Corporation announces today that its CVD Materials Corporation subsidiary is accepting orders for 300 mm size CVD Graphene grown on Cu foil using its patent pending high quality, low cost CVD graphene process technology.

Apr 1st, 2014

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