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Park Systems 2014 Announces Atomic Force Microscopy Image Contest Winner

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University. Her winning submission is an AFM image taken using Park XE Bio of a HeLa Cell used in her research studying drug delivery methods for cancer research.

Posted: Mar 5th, 2014

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Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection Ensuring Accuracy and Lowering Costs

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis in the semiconductor industry. The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM thereby providing the most optimum solution to the FA engineers' needs available in the nanotechnology industry today.

Posted: Mar 5th, 2014

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Dolomite Introduces Groundbreaking Microfluidic System For High Throughput Droplet Microfluidics

Dolomite, a world leader in the design and manufacture of microfluidic products, has launched Telos, an innovative system for high throughput droplet, particle, and flow product generation. It benefits a wide range of applications including: DNA, cell and bead encapsulation and screening, emulsion and foam generation, microparticle and nanoparticle synthesis and micro-reaction engineering.

Posted: Feb 27th, 2014

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Zeiss Achieves Significant Progress in AIMS EUV Project

The Semiconductor Manufacturing Technology business group of ZEISS made significant progress in the development of the actinic aerial image metrology system AIMS EUV. First images of EUV photomasks were taken by the prototype of the system.

Posted: Feb 20th, 2014

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