The Space Research Institute's Surface Science Laboratory at Auburn University has released their exciting test results of Hybrid Plastics' Short-Stop, a novel sprayable, cost effective conformal coating for the suppression of tin whiskers in lead-free solder and electronic circuits.
MTI Instruments, Inc., a worldwide leader in precision measurement solutions, and a subsidiary of Mechanical Technology Incorporated (MTI), announced the acquisition of the tensile stage line of products from Ernest F. Fullam, Inc., a pioneering microscopy accessories company.
Konica Minolta Holdings, Inc. and Konarka Technologies Inc. have signed a comprehensive business partnership and capital investment agreement regarding development and distribution of organic thin-film photovoltaics, and have reached a basic agreement to start full-scale collaboration.
Numonyx B.V. today introduced the industry's first 65nm multiple I/O serial flash memory product line, extending the broad array of Numonyx memory products designed for the rigorous code and data reliability needs of the embedded market.
Nano ePrint Ltd, a pioneer in planar nano-electronics, has announced that it is developing all-printed electronic greeting cards in collaboration with Novalia Ltd, to a specification provided by Hallmark subsidiary Tigerprint Ltd.
SPP Process Technology Systems Ltd. (SPTS), a subsidiary of Sumitomo Precision Products Co., Ltd. (SPP), today announced bookings of nearly $35 million during the fourth quarter of 2009 from the entities acquired last year from Aviza, Inc.
FEI Company, a leading diversified scientific instruments company providing electron and ion-beam microscopes and tools for nanoscale applications across many industries, announces the completion of a multiple system installation at the Materials Ageing Institute (MAI) in France, a utility-oriented research center.
Commerical production of nanostructured microspheric chrome-alumina catalyzers of dehydrated isoparaffins KDI-90 and adsorbents for desiccant drying of olefin-containing feedstreams will be conducted within the the framework of this project.
Malvern Instruments is demonstrating technologies from its broad range of complementary materials characterization solutions at the American Chemical Society Spring 2010 National Meeting and Exposition, from March 21-25, in San Francisco