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Nanometer Online Inspection With Nanovea 3D Non-Contact Profilometer

Crucial applications throughout all industries, which were once inspected with vision and or touch-probe, will now be inspected with the assurance of high speed noncontact nanometer measurement. This is especially critical to batch production with tight tolerance levels which can now be easily monitored to insure quality control via online communication.

Posted: Jan 12th, 2010

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IBM Earns Most U.S. Patents for 17th Consecutive Year

IBM today announced that it received 4,914 U.S. patents in 2009, marking the 17th consecutive year it has topped the list of the world's most inventive companies. IBM also announced that, for the first time, it will offer its invention know-how and patent portfolio management software to clients seeking to enhance their intellectual property (IP) management capabilities in support of innovation-based growth strategies.

Posted: Jan 12th, 2010

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AIXTRON Participating in National German OLED Research Project 'So-Light'

A new national R+D project has recently been started in Germany focusing on the development of OLED displays and lighting applications. AIXTRON will participate in this 14.7 million Euro project together with ten other partners with the target to strengthen Germany's leading position in the fast growing OLED market.

Posted: Jan 12th, 2010

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New Energy Unveils Patent-Pending Technology to 'Spray' Solar Cells onto See-Thru Windows to Generate Electricity

New Energy Technologies, Inc., developer of MotionPower technologies for generating sustainable electricity from the kinetic energy of moving vehicles and SolarWindow technologies capable of generating electricity on see-thru glass windows, today announced that researchers have developed a novel, patent-pending process for spraying solar cells and their related components onto glass.

Posted: Jan 12th, 2010

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New NeoFox Sport Handheld Optical O2 Sensor from Ocean Optics

The NeoFox Sport from Ocean Optics is a portable, handheld optical oxygen sensor for measuring dissolved and gaseous oxygen pressure in a variety of media. The sensor uses a proprietary sol-gel coating that is embedded with an oxygen indicator and can be applied to patches or probes.

Posted: Jan 11th, 2010

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Nova Integrated Metrology for Etch Deployed by a Major Foundry in Asia Pacific

Nova Measuring Instruments Ltd. provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that a major foundry in Asia Pacific has decided to deploy its NovaScan Integrated Metrology (IM) solution coupled with NovaMARS shape profiling software, for 45nm gate Etch Advanced Process Control.

Posted: Jan 11th, 2010

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