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Veeco Introduces the MultiMode 8 High-Performance SPM

Veeco Instruments Inc., a leading provider of atomic force and scanning probe microscopes (AFM/SPMs) to the Research and Industrial communities, announced today the release of the MultiMode 8 High-Performance Scanning Probe Microscope (SPM).

Dec 1st, 2009

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Veeco Releases Two New Breakthrough AFM Scan Modes

Veeco Instruments Inc., a leading provider of atomic force microscope instrumentation to the Research and Industrial communities, announced today the introduction of two patent-pending AFM scan modes, ScanAsyst and PeakForce QNM.

Dec 1st, 2009

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