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Park Systems Introduces QuickStep SCM New High Speed Scanning Capacitance Microscopy

Park Systems introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series, the leading AFM products for researchers and engineers in the semiconductor industry, Park's QuickStep SCM provides accurate dopant profiles of semiconductor device structures, 5 to 10 times faster than any other competing SCM atomic force microscopy systems.

Nov 29th, 2013

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Leti Announces MEMS Research Collaboration with OMRON

CEA-Leti today announced a development agreement that will utilize Leti's deep MEMS expertise and leading-edge infrastructure with OMRON, a global leader in factory automation and control solutions for the transportation, healthcare and consumer-goods industries.

Nov 27th, 2013

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