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Achieve Up to 10x Faster Particle Analysis

Oxford Instruments' automated feature and particle analysis system is now available with new image acquisition hardware INCAmicsF+ for even faster and more accurate data acquisition.

Posted: Jul 30th, 2009

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UMC Adopts Cadence 40-Nanometer Reference Flow

The new reference flow provides designers with a reliable, UMC-validated methodology incorporating the latest in low power techniques and model-based DFM analysis and optimization capabilities for maximum power efficiency, superior quality of results, and accelerated yield ramp for advanced node designs.

Posted: Jul 30th, 2009

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GLOBALFOUNDRIES Announces Strategic Customer Engagement with STMicroelectronics

One of the world's leading suppliers of semiconductor solutions, ST will partner with GLOBALFOUNDRIES to produce products based on 40nm Low Power (LP) bulk silicon technology. The 40nm LP process is ideal for the next generation of wireless applications, handheld devices, and consumer electronics, which require excellent performance and long battery life.

Posted: Jul 29th, 2009

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