API Nanotronics Corp., a leading supplier of electronic systems and sub-systems, components, nano-optics and nanotechnology products to the aerospace, defense and communications sectors, today announced the acquisition of substantially all of the operating assets of Cryptek Technologies.
FEI will collaborate with experts in SEMATECH?s Metrology divisions to develop high-resolution capabilities of transmission electron microscopy (TEM) analysis, with electron energy loss spectroscopy (EELS) and focused ion beam (FIB) technology to address critical needs in process development and defect analysis.
The Chartered process offering, jointly developed with IBM, is based on Chartered's enhanced 65nm low-power process (65nm LPe), and includes an IBM RF physical design kit (PDK) available from Chartered.
Applied Materials, Inc. will emphasize the urgency of preparing students for the high tech jobs of the future during SEMICON West, held in San Francisco this week. The company will also discuss how a shortage of talent may affect the industry and America?s position as a global technology leader.
Olympus Integrated Technologies America, Inc. announces that it has provided an infrared inspection and defect review system with metrology software to SEMATECH, the global consortium of semiconductor manufacturers, for its 3D R+D Center at the College of Nanoscale Science and Engineering's Albany NanoTech Complex.