The wafer-processing section at this year's SEMICON West will feature engineers from CyberOptics Semiconductor discussing the role of a newly developed particle-sensing technology to monitor airborne particles in process equipment in real-time to validate and analyze wafer contamination.
DuPont today announced plans with the U.S. Department of Energy for a $9 million solar research program - part of the company's overall effort in providing more mainstream solar photovoltaic products for commercial and residential applications.
SUSS MicroTec, one of the world´s leading suppliers of process and test solutions for microstructuring applications in semiconductor and related markets, today announced a new structure for sales in Asia based in Singapore.
Using an Andor Electron Multiplying CCD (EMCCD) camera in combination with an imaging spectrograph and a sheath flow cuvette, researchers at the La Jolla Bioengineering Institute in California, have been able to analyse individual metal nanoparticles at rates of 100 per second or faster.
KLA-Tencor Corporation, a leading supplier of process control and yield management solutions for the semiconductor and related industries, announced XP, a new upgrade package for 28XX broadband brightfield inspection systems.
Die Nanostart-Beteiligung ItN Nanovation AG wird im Rahmen eines Großprojektes erstmals in Deutschland eine kommunale Kläranlage mit CFM-Systems Modulen bestücken. Damit gelingt es dem Unternehmen, ein wichtiges, großvolumiges Referenzprojekt zu realisieren, mit dem die technologische und ökonomische Überlegenheit keramischer Flachfiltermembrane bei der Wasserfiltration erneut gezeigt werden kann.
JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope, the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16.
Microfluidics and Particle Sciences Inc. have formed a strategic alliance to help biopharmaceutical companies leverage the most advanced and reliable nanotechnology and formulation methods available to develop, analyze and commercialize Active Pharmaceutical Ingredients.
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has sponsored the premier issue of Project TEST, in cooperation with Electronic Products magazine and the Hearst Electronics Group.
Nova Measuring Instruments Ltd., provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, received a multiple tool order for its integrated NovaScan metrology solution for measurement of Copper line thickness by a leading foundry.