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IMEC successfully transferred MemoryVAM (Memory Variability Aware Modeling), the first EDA tool for statistical memory analysis, to Samsung Electronics. The tool predicts yield loss of SRAMs caused by the process variations of deep-submicron IC technologies.
Apr 21st, 2009
Read moreMetryx, Limited today announced that it has shipped its second Mentor OC23 mass metrology system to a key US-based GaAs manufacturer. The company will implement the system in volume bulk acoustic wave device production, to measure both deposition and etch processes on product wafers.
Apr 21st, 2009
Read moreAIXTRON AG announced the receipt of a purchase order for a 4 inch Black Magic PECVD for carbon nanotube (CNT) growth from The Georgia Institute of Technology within the first quarter 2009.
Apr 21st, 2009
Read moreSokudo Co., Ltd. today launched its breakthrough SOKUDO DUO platform, a unique new concept in photoresist coat/develop track systems that provides customers with the ultra-high productivity needed to optimize leading-edge lithography processing.
Apr 20th, 2009
Read moreExpression Pathology Inc., a leading developer of technology for tissue protein analysis, announced that it has received additional financing of $6.5 million. The financing was led exclusively by Abraxis BioScience.
Apr 20th, 2009
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NIL Technology now offers a Quick Polymer Stamp (QPS), facilitating a fast nanoimprint approach.
Apr 20th, 2009
Read moreVeeco Instruments Inc. announced today that Shandong Raysun Huaguang Optoelectronics Co., Ltd. of China has qualified Veeco's gallium nitride and arsenic phosphide metal organic chemical vapor deposition systems for high volume production of red and blue high-brightness light emitting diodes.
Apr 20th, 2009
Read moreRudolph Technologies, Inc. and SEMATECH, the global consortium of leading chipmakers, announced today that Rudolph has joined SEMATECH's 3D Interconnect Program at the College of Nanoscale Science and Engineering of the University at Albany.
Apr 20th, 2009
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Zeiss has overcome the challenges of imaging deep inside living tissues with the launch of the LSM 7 MP, a purpose-built multiphoton laser scanning microscope that, for the first time, incorporates two separate scanners.
Apr 20th, 2009
Read moreQD Vision, developer of nanotechnology-based products for lighting and displays, today announced it has been selected by the Department of Energy (DoE) to receive more than $700,000 in funding for a project that will significantly contribute to the development of enhanced solid state lighting technologies.
Apr 20th, 2009
Read moreARM today announced the availability of the industry's most comprehensive IP platform for TSMC's 40nm G manufacturing process.
Apr 20th, 2009
Read moreSunfilm, AG and Applied Materials, Inc., today announced that the world's first tandem junction SunFab Thin Film Line installed at Sunfilm's Grossroehrsdorf facility achieved factory acceptance on April 14, 2009.
Apr 20th, 2009
Read moreEarly Warning today displayed its Biohazard Water Analyzer which offers the next generation in microbial testing. Using a unique combination of advanced technologies, the Analyzer goes beyond lab culturing of indicator coliforms and directly measures individual species of pathogenic bacteria, protozoa and viruses in the same test.
Apr 17th, 2009
Read moreGrace Semiconductor Manufacturing Corporation, one of the leading semiconductor foundries in China, announced delivery of its advanced 0.18 micron RFCMOS process design kit through an exclusive 0.18 micron RFCMOS collaboration with Sentinel IC Technologies.
Apr 17th, 2009
Read moreThe Fibermetric system from FEI delivers statistically valid data in minutes to improve fiber and filter material development and manufacturing.
Apr 17th, 2009
Read moreEnable IPC Corporation today announced that the cover story of the April 2009 edition of the American Ceramic Society Bulletin features Enable IPC's SolRayo subsidiary.
Apr 16th, 2009
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