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Asylum Research, a premier manufacturer of atomic force microscopes, announced that the federal court in Los Angeles dismissed two of the five Veeco Instruments Inc. patents from the infringement lawsuit commenced by Veeco in September 2003 and that the judge's summary judgment order cast a large shadow over their remaining patents.
Nov 28th, 2007
Read moreCVD Equipment Corporation announced today that Gary Dyal, Director of Marketing and Sales will present at the 3rd Annual Axiom Capital/Livingston Nanotechnology Conference at the Marriott Financial Center in New York City on December 7th, 2007.
Nov 27th, 2007
Read moreVeeco Instruments Inc. today announced that the United States District Court in Los Angeles issued an order in Veeco's patent infringement action against Asylum RESEARCH Corporation.
Nov 27th, 2007
Read moreRonald DeMeo, MD, MBA, president and chief executive officer with Radiation Shield Technologies, today announced the company's acquisition of Russia and Singapore patents for Demron, the world's first nuclear radiation-blocking fabric.
Nov 27th, 2007
Read moreAccording to a new technical market research report, the U.S. market for molecular, nanoscale, and atomic imaging was worth some $1.6 billion in 2006 and is expected to increase to $1.8 billion in 2007 and $4.2 billion by 2012.
Nov 27th, 2007
Read moreOasmia Pharmaceutical announces licensing agreement with Orion Corporation regarding new innovative ovarian cancer drug candidate, Paclical.
Nov 27th, 2007
Read moreBIND Biosciences, Inc., a privately held biopharmaceutical company developing 'smart' therapeutic targeted nanoparticles capable of differential delivery and controlled drug release to diseased tissue, announced today that it has secured a $16 million Series B financing.
Nov 27th, 2007
Read moreVESTA Technology, Inc., a leading supplier of production proven thermal process systems and an industry innovator in atomic layer deposition (ALD), today announced it received a multi-chamber order for its VULCAN Single wafer High-k and Metal ALD system from the largest leading foundry based in Taiwan.
Nov 27th, 2007
Read moreTool will be used for logic R&D for system-on-chip applications at 45-nm node and below.
Nov 27th, 2007
Read moreReveal to investigate image quality enhancements and new carbon nanotube X-ray source for Computed Tomography based explosive detection systems.
Nov 27th, 2007
Read moreEnable IPC Corporation today announced that CEO David Walker will give a presentation on the company at the Global Energy and Natural Resources Conference in New York on December 4, 2007.
Nov 27th, 2007
Read moreIndustrial Nanotech, Inc. announced today that the Agricultural University of Athens has confirmed that the Companyâ??s patented Nansulate coatings save energy with no detriment to plant growth in commercial agricultural greenhouse applications.
Nov 27th, 2007
Read moreCutting-edge contamination-free extraction and manipulation.
Nov 26th, 2007
Read moreThe annual TechConnect Summit represents the world's largest peer-vetted deal flow for technology partnering, investing and licensing.
Nov 26th, 2007
Read moreApplied Materials, Inc. today unveiled its Applied UVision 3 system, the industry's highest productivity DUV1 Brightfield wafer inspection tool with the critical-defect detection sensitivity required for 45 nanometer (nm) FEOL2 and immersion lithography.
Nov 26th, 2007
Read moreNanoBattery successfully powers smart shell.
Nov 26th, 2007
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