Nanotechnology Business News – overview page 7

Subscribe to our Nanotechnology Business News feed

PI's New 4-Channel Dynamic Cost-Effective Digital Piezo Controller

Also available for quick delivery, this controller is well-suited for multi-axis applications from microscopy to semiconductor metrology.

Oct 20th, 2016

Invite to the Annual UK Scanning Probe Microscopy Conference and User Meeting

Bruker Nano Surfaces would like to invite you to their annual UK Scanning Probe Microscopy Conference and User Meeting on 13th and 14th December 2016 at University of Cambridge.

Oct 13th, 2016

PI's New High-Speed, NanoCube 3-Axis Piezo Motion Stage

Higher scanning speed, ceramic-insulated acutators for long life, flexures for friction-free motion, and capactive sensors for sub-nm precise positioning make this new piezo nanopositioner ideal for fast fiber alignment and microscopy applications.

Oct 4th, 2016

New White Ppaer: Conductive AFM in SEM using solid Platinum tips

With AFSEM the gradual increase of conductivity can be studied directly between the irradiation steps, without sample transfer. Since the measurements are performed in the vacuum of the SEM, contamination issues that are generally encountered in air are reduced.

Sep 24th, 2016

White Paper Explains Design and Preparation of NanoPositioners for High Vacuum

Vacuum and UHV applications in research and industry are increasing in importance as testing and manufacturing specifically require vacuum or cryogenic environments.

Sep 24th, 2016

AFSEM Offers a Solution for Conductive AFM in SEM with Self-sensing Cantilevers

GETec and Nanosurf now offer self-sensing conductive cantilevers for AFSEM that enable conductivity probing in the vacuum environment of the SEM.

Sep 22nd, 2016

Bruker Introduces Complete Commercial AFM-Based SECM Solution

PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information.

Sep 21st, 2016

Cost-Effective Piezo Stage Package for High-Resolution Microscopy Released by PI

Affordable system with a new all-digital servo controller and auto-calibration chip, long-life PICMA piezo drives comes in 6 different variations optimized for travel range, speed, linearity, and stability.

Sep 17th, 2016

SiP Test and Production Alignment Engine from PI

A solution is now available for fast, parallel, nanoscale-accurate, multi-degree-of-freedom global optical alignment optimization required in key SiP production steps from planar test to packaging.

Sep 7th, 2016

Value Added Piezo Element Assembly Speeds up OEM Integration, Saves Cost

Fast response, high bandwidth and force, and virtually unlimited resolution make piezoelectric transducers invaluable to modern high tech applications including flow measurement, distance gauging, bio-medical dispensing and aerosol generation, as well as metrology, semiconductor testing, and aerospace technology.

Aug 31st, 2016

Palm-sized Precise XY / XYZ Motorized Stage is Fast Too, From PI

PI has released a low-profile motorized positioning stage with a very small footprint of 60x86mm and a travel range of 25mm, best suiting it for research and industrial applications including fiber alignment, metrology, quality assurance testing, photonics packaging, test equipment, and micromachining.

Aug 19th, 2016

Ultra-Fast Compact Piezo Nanopositioning Stage, from PI

Full integrated flexure-guided design delivers repeatable subnanometer step precision.

Aug 4th, 2016

Park Systems Launches Park NX20 300mm Research Atomic Force Microscope with Full 300 mm Semiconductor Wafer Scan

Park Systems, world leading manufacturer of Atomic Force Microscopes (AFM) today announced Park NX20 300mm, the first and only research AFM on the market capable of scanning the entire sample area of 300 mm wafers using a 300 mm vacuum chuck while keeping the system noise level below 0.5angstrom RMS.