STMicroelectronics, Soitec and CMP (Circuits Multi Projets) today announced that ST's CMOS 28nm Fully Depleted Silicon-On-Insulator (FD-SOI) process, which uses innovative silicon substrates from Soitec, is now available for prototyping to universities, research labs and design companies through the silicon brokerage services provided by CMP.
ASML and Cymer have collaborated closely for over a year, and this merger is the natural evolution of their existing cooperation in developing EUV technology. Combining Cymer's expertise in EUV light sources with ASML's expertise in lithography systems design and integration will reduce the risk and accelerate the introduction of this extremely complex technology.
Drug delivery research in India will advance with help from New Zealand, with the gift of a highly advanced qNano system to Prof. Rinti Banerjee from the Department of Biosciences & Bioengineering at the Indian Institute of Technology (IIT) in Mumbai.
Picosun Oy, leading atomic layer deposition (ALD) equipment manufacturer has co-organized the 1st International Conference on ALD Applications and 2nd China ALD Conference in cooperation with Fudan University, one of China's top universities.
Toronto-based Integran Technologies Inc. today announced further advances in its "structural metal plating-on- polymer" technology (Nanovate NP) for enhancing fuel efficiency and reducing greenhouse gas emissions by enabling the cost-effective manufacture of lightweight transportation parts.
NanoSight, leading manufacturers of unique nanoparticle characterization technology, reports on the characterization of nanoparticles at the NanoLab of the Norwegian University of Science & Technology, NTNU.
Anasys Instruments reports on joint research with the University of Illinois' Department of Engineering where nanotechnology-based materials identification enables critically needed chemical metrology for nano-manufacturing.
The ContourGT-I has been optimized to accelerate and simplify measurement setup and feature-tracking and is the world's first bench top profiling system to incorporate Bruker's proprietary tip/tilt head design, along with fully automated functionality, including turret, lenses, and illumination.