Cadence today announced that the first products in the Cadence DDR4 SDRAM PHY and memory controller design intellectual property (IP) family have been proven in silicon on TSMC's 28HPM and 28HP process technologies.
Entegris, Inc. will feature the 10 nanometer-rated Intercept HPM liquid filter, its latest generation of advanced filtration solutions for very demanding advanced semiconductor manufacturing, at the SEMICON Taiwan tradeshow being held in Taipei, Taiwan, on September 5-7, 2012.
GBS and Digital Surf announced the signature of an agreement whereby MountainsMap Imaging Topography software, based on Digital Surf's Mountains Technology, has been integrated into GBS's smartWLI white light interferometer product family.
Hy-Power Nano Inc. has launched its first nanotechnology enabled product, the Hy-Power Clear Liquid Solar Blocker, and demonstrated it to a group of customers at the International Conference Centre in Mississauga.
CRAIC Technologies introduces Spectral Surface Mapping which allows automatic spectral mapping of surfaces with microscopic spatial resolution. 3D maps can be generated of surfaces for transmission, absorbance, reflectance, polarization, fluorescence, phosphorescence and even Raman spectra.
Picosun Oy, Finnish, globally operating manufacturer of top-quality Atomic Layer Deposition (ALD) systems reports excellent deposition results with its new Picoflow diffusion enhancer feature. At customer sites in Asia and Europe, ultra-high conformality and uniformity ALD metal oxide thin films were deposited on extremely challenging high aspect ratio trenches on silicon wafers and complicated microchannel structures on silicon chip.
Bruker announced today that a leading semiconductor supplier has purchased multiple Bruker ContourGT-X 3D optical microscope systems for their packaging factories in Asia and North America to support copper wire bond inspection and process control needs.
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM systems in the group of Dr Bart Hoogenboom of the London Centre for Nanotechnology.