Scientists in California are reporting development of a new generation of the microcapsules used in carbon-free copy paper, in which capsules burst and release ink with pressure from a pen. The new microcapsules burst when exposed to light, releasing their contents in ways that could have wide-ranging commercial uses from home and personal care to medicine.
High-performance energy storage technologies for the automotive industry or mobile phone batteries and notebooks providing long battery times - these visions of the future are being brought one step nearer to the present by scientists from Graz University of Technology.
Researcher Dr. David H. Hughes of the Air Force Research Laboratory in Rome, N.Y. is leading a team investigating long-distance, mobile optical links imperative for secure quantum communications capabilities in theater.
A consortium led by The University of Texas Health Science Center at Houston has been awarded a major grant from the National Cancer Institute (NCI) to establish a center to conduct innovative cancer research.
Unveiling plans for a 100,000(+)-square-foot research facility located at the South Campus of Gateway University Research Park in Greensboro, N.C., North Carolina Agricultural and Technical State University and The University of North Carolina at Greensboro will host the official groundbreaking of the Joint School of Nanoscience and Nanoengineering (JSNN) on Monday, Nov. 9.
The development of interaction between Japanese and Russian industrial enterprises in the sphere of nanotechnologies has good prospects, President of Konica-Minolta IJ Technologies Akiyoshi Ono told Itar-Tass in Tokyo on Tuesday.
The assessment panel awarded the prize to Prof. Christoph Cremer for his revolutionary light microscopy technology Vertico SMI. The patented process developed by this researcher from the University of Heidelberg makes it possible to image and analyze cells in two dimensional resolution as low as of 10 nanometers and with a resolution in the third dimension of 40 nanometers.
Researchers from SEMATECH's Front End Processes program have developed a comprehensive transistor noise model capable of extracting defect characteristics from low frequency noise data in advanced gate stack transistors using both conventional and novel dielectrics.