NANOSENSORS SuperSharpSilicon™ AFM tips are developed for high resolution AFM imaging.

The typical AFM tip radius of NANOSENSORS SuperSharpSilicon™ AFM tips is around 2 nm.

NANOSENSORS SuperSharpSilicon™ AFM Probes are available on different cantilever types for non-contact, dynamic, acoustic or tapping mode applications as well as for force modulation techniques.

Available types:

SSS-NCH (standard tapping mode type)
Typical force constant: 42 N/m
Typical resonance frequency: 330 kHz

SSS-NCHR (standard tapping mode type with aluminum reflex coating on the backside of the AFM cantilever):
Typical force constant: 42 N/m
Typical resonance frequency: 330 kHz


SSS-NCL:
Typical force constant: 48 N/m
Typical resonance frequency: 190 kHz

SSS-NCLR:
Typical force constant: 48 N/m
Typical resonance frequency: 190 kHz


SSS-SEIH:
Typical force constant: 15 N/m
Typical resonance frequency: 130 kHz

SSS-SEIHR:
Typical force constant: 15 N/m
Typical resonance frequency: 130 kHz


SSS-FM ( force modulation mode type ) :
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz

SSS-FMR ( force modulation mode type with aluminum reflex coating on the backside of the AFM cantilever ):
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz

Please contact us if you have further questions or have a look at the SuperSharp Silicon AFM probes brochure: http://www.nanosensors.com/SuperSharpSilicon.pdf

Application examples can be found in the NANOSENSORS blog. E.g. https://www.nanosensors.com/blog/?s=SSS-NCH