Conductive and Wear-Resistant Platinum Silicide AFM Probes
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- Vendor:
- NANOSENSORS
- Country:
- Switzerland | Contact Details
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NANOSENSORS™ conductive and wear resistant Platinum Silicide AFM probes are especially designed for applications where AFM probes that unite almost metal-like conductivity with high wear resistance and a relatively small AFM tip radius are needed.
Three types of Platinum Silicide AFM probes with different AFM cantilever values are currently available:
PtSi-CONT – for contact mode / repulsive mode AFM imaging
- this AFM probe type can be used for force distance spectroscopy or Pulsed Force Mode ( PFM ), Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM ( TUNA ) and Scanning Capacitance Microscopy ( SCM )
Typical force constant: 0.2 N/m
Typical resonance frequency: 13 kHz
PtSi-FM – for force modulation mode imaging
– this AFM probe type can be used for Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM ( TUNA ) , Scanning Capacitance Microscopy ( SCM ), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KPFM)
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
PtSi-NCH
– for non-contact mode / tapping mode /attractive mode / dynamic mode AFM – can be used for Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM (TUNA ) and Scanning Capacitance Microscopy ( SCM )
Typical force constant: 42 N/m
Typical resonance frequency: 330 kHz
Please contact us if you have further questions or have a look at http://www.nanosensors.com/pdf/platinum_silicide.pdf
Application examples can be found in the NANOSENSORS blog: https://www.nanosensors.com/blog/tag/platinum-silicide-afm-probes/ -
Research Driven Excellence since 1990
Since 1990 researchers world-wide rely on the guaranteed high quality of NANOSENSORS™ probes for Atomic Force Microscopy and Scanning Probe Microscopy. NANOSENSORS™ SPM tips are used in university research and commercial R&D labs where high resolution, consistent quality and reproducibility of results are essential.
Our cutting-edge products include high-resolution AFM tips with a typical radius of 2 nm, highly wear resistant conductive AFM probes, AFM probes with very small variation in force constant and resonance frequency and very low thermal drift which are especially popular for biological applications and many more.
Since 1990 we provide the most consistent AFM probes quality, year by year, batch by batch, wafer by wafer, AFM tip by AFM tip.
On our NANOSENSORS blog we regularly showcase scientific articles published by the many users of our AFM probes.
NANOSENSORS™ is a trademark of NanoWorld AG
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