Magnetic Force Microscopy AFM tips
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- Vendor:
- NANOSENSORS
- Country:
- Switzerland | Contact Details
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NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and investigating sample surfaces with magnetic features:
PPP-MFMR – AFM tip with hard magnetic coating, sensitivity, resolution and coercivity designed for standard magnetic force microscopy applications
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
PPP-LM-MFMR – low moment MFM tip designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the MFM tip and enhanced lateral resolution
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
PPP-LC-MFMR – low coercivity MFM tip with soft magnetic coating designed for the measurement of magnetic domains in soft magnetic samples
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
PPP-QLC-MFMR – low coercivity MFM probe designed for high operation stability and low disturbance of magnetic samples under ultrahigh vacuum ( UHV ) conditions
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
SSS-MFMR – SuperSharp MFM probe for high resolution magnetic force imaging, low magnetic moment for reduced disturbance of soft magnetic samples
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
SSS-QMFMR – SuperSharp MFM probe for high resolution magnetic force imaging with a high mechanical Q-factor for applications in ultrahigh vacuum ( UHV )
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz
Please contact us for further details or have a look at the NANOSENSORS MFM probes brochure: http://nanosensors.com/Magnetic_Force_Microscopy.pdf
Application examples for NANOSENSORS AFM probes for Magnetic Force Microscopy can be found in the NANOSENSORS blog https://www.nanosensors.com/blog/?s=MFM -
Research Driven Excellence since 1990
Since 1990 researchers world-wide rely on the guaranteed high quality of NANOSENSORS™ probes for Atomic Force Microscopy and Scanning Probe Microscopy. NANOSENSORS™ SPM tips are used in university research and commercial R&D labs where high resolution, consistent quality and reproducibility of results are essential.
Our cutting-edge products include high-resolution AFM tips with a typical radius of 2 nm, highly wear resistant conductive AFM probes, AFM probes with very small variation in force constant and resonance frequency and very low thermal drift which are especially popular for biological applications and many more.
Since 1990 we provide the most consistent AFM probes quality, year by year, batch by batch, wafer by wafer, AFM tip by AFM tip.
On our NANOSENSORS blog we regularly showcase scientific articles published by the many users of our AFM probes.
NANOSENSORS™ is a trademark of NanoWorld AG
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