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  • ORCA™ Conductive AFM Imaging
  • ORCA™ Conductive AFM Imaging

ORCA™ Conductive AFM Imaging


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  • Ben Ohler,Asylum Research
  • ORCA™ Conductive AFM Imaging

Contact Details

  • Asylum Research
  • Ben Ohler
  • 6310 Hollister Ave
  • Santa Barbara
  • CA
  • United States
  • +1 805-696-6466

Contact Supplier

  • Ben Ohler,Asylum Research

  • Conductive AFM is a powerful current sensing technique for electrical characterization of conductivity variations in resistive samples. It allows current measurements in the range of hundreds of femtoamps to ten microamps. Conductive AFM can simultaneously map the topography and current distribution of a sample. It is a measurement useful in a wide variety of material characterization applications including thin dielectric films, ferroelectric films, nanotubes, conductive polymers, and others.

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  • Asylum Research is the technology leader for atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Started by former employees of Digital Instruments in 1999, we are a company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 200 years combined AFM/SPM experience from our scientists, engineers and software developers.

    Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more.

    Asylum’s product line offers advanced imaging and measurement capabilities for a wide range of samples, including Dual AC™ mode, iDrive,™ Q-control, electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.

    Asylum’s MFP-3D, set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes.

    Asylum’s new Cypher AFM is the world’s first completely new small sample AFM/SPM in over a decade, and sets the new standard as the world’s highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.

    Ask us about our legendary product and applications support and our exclusive 6-month money-back satisfaction guarantee. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM tips. We also supply a variety of accessories for AFM/SPM. We are dedicated to providing the most technically advanced AFM for researchers who want to take their experiments to the next level.
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