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  • OPTIMUS™ TKD Detector Head

OPTIMUS™ TKD Detector Head


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  • Stefan Meier,Bruker Nano GmbH
  • OPTIMUS™ TKD Detector Head

Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591

Contact Supplier

  • Stefan Meier,Bruker Nano GmbH

  • Bruker’s high performance e-Flash EBSD detector series can be equipped with a special detector head designed for optimal geometric conditions in performing Transmission Kikuchi Diffraction analysis (TKD) in a SEM. It is interchangeable with the standard detector head of any e-Flash EBSD detector, supporting EBSD and TKD using the same detector.

    The unique OPTIMUS™ TKD detector head has a horizontal phosphor screen that can be positioned under an electron transparent sample to acquire the diffracted electron signal where it is strongest. Additionally to acquiring Kikuchi patterns with unmatched sensitivity, the OPTIMUS™ TKD detector head also virtually transforms a SEM into a TEM by giving access to SAED (Selected Area Electron Diffraction) like patterns as well as to dark and bright field imaging capabilities.

    Highest spatial resolution in orientation mapping

    Placing the phosphor screen directly beneath the sample has two major advantages compared to a standard EBSD detector with vertical screen:

    • much stronger signal
    • lowest possible gnomonic projection distortions

    The first advantage results either in data acquisition that is either faster or can be performed with lower beam current and/or acceleration voltage. Apart from an improved lateral spatial resolution a low beam current also minimizes carbon contamination of the sample. A low acceleration voltage is useful for the analysis of very thin samples, as the probability of interaction with the sample crystal lattice (diffraction) is increased.

    Distortions caused by gnomonic projection are a common issue in EBSD and particularly affect TKD using a vertical screen. The OPTIMUS™ TKD detector head allows screen positioning so that the pattern center is in the center of the screen, providing even better geometric conditions than those for EBSD. This insures that the Kikuchi patterns will have minimum distortions further improving band detection and subsequent indexing accuracy.

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
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