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Request the latest price from Bruker Nano GmbH

  • Stefan Meier,Bruker Nano GmbH

Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591

Contact Supplier

  • Stefan Meier,Bruker Nano GmbH

  • The High-End, Easy-to-Use EBSD Analysis System

    Bruker's QUANTAX EBSD analysis system provides the analyst with an easy to use and advanced tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.

    • In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, now includes the ARGUS™ forescattered/backscattered electron imaging system
    • Fast acquisition with 630 patterns/s (4x4 binning) or 930 patterns/s (8x8 binning) using the e-Flash1000 detector
    • High resolution pattern acquisition with the e-FlashHR, providing pattern images of up to 1600x1200 pixels and an acquisition speed of 140 patterns/s (10x10 binning) and 170 patterns/s (20x20 binning). It supports measurements at low acceleration voltages (down to 5 kV) and low beam currents (down to 0.1 nA).
    • Signal assistant for acquisition setup
    • Calibration assistant for geometrical setup
    • Point inspector for checking data quality
    • Band positions are saved
    • Band detection and indexing with up to 3,000 patterns/s
    • Fast re-indexing with up to 54,000 points/s
    • Offline re-calibration
    • Advanced phase ID
    • Offline phase ID
    • EDS-assisted phase discrimination
    • LED detector position indicator and multiple features for safe operation
    • Fully software controlled detector with all electronics integrated
    • Simultaneous EBSD and EDS acquisition at up to 930 patterns/s, supported by in-situ tilt feature to optimally position both detectors
    • Easy-to-use EBSD software with a single user interface
    • Individual settings can be stored in a personal user profile

    Transmission Kikuchi Diffraction

    QUANTAX EBSD is available with unequaled support for Transmission Kikuchi Diffraction (TKD) analysis through the OPTIMUS™ TKD detector head and the TKD toolkit. The ESPRIT 2 software features TKD support as well.

    Get more information

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
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