DENSsolutions now introduces an in situ TKD stage for Scanning Electron Microscopes (SEM). For the first time in the market, this stage allows you to perform microstructural characterization using Transmission Kikuchi Diffraction (TKD) while heating or biasing your sample.

The TKD stage will save you valuable time on the TEM, as you can now perform a quick preliminary in situ sample characterization inside the SEM that would have otherwise taken you much longer to accomplish using the TEM.

In situ characterization of the grain size and distribution, crystal orientation and texture, phase of materials like metals, ceramics, semiconductor and composites from various applications fields such as automotive, aerospace, electronics, power generation, etc.