XiGo Nanotools' range of particle characterization products provides measurements of particle size, particle size distribution, and surface area. XiGo Nanotools also offers contract testing, consulting, or training in particle characterization.
XinRay Systems LLC is a joint venture between Siemens Medical Solutions and Xintek. The company develops and manufactures distributed x-ray sources for a broad range of applications including diagnostic medical imaging, homeland security, and industrial inspection. Its proprietary nanomaterial based field emission electron sources have superior emission properties including high emission current and long term stability.
Xitronix Corporation is a leader in the development and implementation of high precision Photo-Reflectance metrology equipment for the worldwide semiconductor device manufacturing process control market. The breakthrough process control capability provided by Xitronix' Photo-Reflectance technology is essential to the volume manufacture of nanoelectronics at the 45 nm node and beyond.
Xolve (previously Graphene Solutions) is a manufacturer of purified and size selected carbon nanotubes, graphene and nanographene. The company is working to commercialize simple room temperature processing of graphene and other nanoparticle composites, solutions and coatings.
XsunX is focused on lowering the cost of solar power generation and increasing solar energy applications through the development of unique thin film photovoltaic (TFPV) materials, designs, and manufacturing processes. Includes Hybrid Nano Crystalline for high performance opaque applications rivaling silicon wafer efficiencies.
Xtalic is focused on providing unique nanostructured alloys that provide corrosion resistance, wear resistance and exceptional appearance across a wide range of metal coating applications including decorative, functional and electronics.
Zygo esigns, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring displacement, surface figure, and optical wavefront. Metrology and optical markets for end-user and OEM applications include semiconductor capital equipment, aerospace/defense, automotive, and research.