The CSpace Volumetric Imaging System (static volume display technology) is the company's flagship technology that is being rapidly developed. CSpace uses a clear volumetric image space within which invisible nano-size up-conversion material is dispersed. A volumetric 3D image is rendered when invisible laser beams are precisely directed into the image space, exciting the nano-materials to emit visible light and thus display a full color, volumetric image.
Develops and builds instruments and probes which offer chemical, mechanical, and thermal analysis at the sub-100nm scale. The Company's technology and products are being used to address metrology and analysis challenges in the polymers, pharmaceuticals, data-storage, and advanced-materials markets.
ASPEX (Application Specific Products employing Electron Beam and X-ray technology) has engineered a particle imaging system that harnesses the full power and dynamic flexibility of electron-beam analysis, packaged in a compact and fully integrated system with total support. When accurate particulate characterization is important, electron-beam analysis is the method of choice.
Bruker is one of the world's leading analytical instrumentation companies. Bruker systems cover a broad spectrum of applications in all fields of research and development and are used in all industrial production processes for the purpose of ensuring quality and process reliability.
The company has developed a unique process for the deterministic production of carbon nanotube (CNT) devices. This process allows Carbon Design Innovations to predictably produce CNTs with specified geometries and properties such as angle and length that offer many benefits for atomic force microscopes.
CRAIC Technologies™ is a developer of UV-visible-NIR range scientific instruments for microanalysis. These include the QDI series UV-visible-NIR microspectrophotometer instruments designed to non-destructively measure the optical properties of microscopic samples. CRAIC's UVM series microscopes cover the UV, visible and NIR range and hel analyze with sub-micron resolutions far beyond the visible range.