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Nanotechnology Products, Applications & Instruments; USA, Analysis, page 2

Nanotechnology Products, Applications & Instruments


Showing results 21 - 40 of 74 for companies in category Analysis in USA:

Offers sample preparation instruments and advanced imaging technology. Their SEM and TEM products are particularly suited for nanotechnology applications.
Since 1961 Gamma Scientific has produced LED, display and light measurement test solutions for production and R&D environments. With over 50 years of innovation in optics, photonics and optoelectronics metrology, Gamma Scientific instruments are trusted by leading global organizations that require high-speed, precision measurements and custom configurations for the most challenging environments.
A manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes.
Scientific instruments such as SEM, TEM, Dedicated STEM, FIB, CD-SEM, DF Wafer Inspection System and Defect Review SEM.
HORIBA Scientific offerings encompass elemental analysis, fluorescence, forensics, GDS, ICP, particle characterization, Raman, spectral ellipsometry, sulfur-in-oil, water quality, and XRF.
Hummingbird Scientific offers custom engineering services and products for cutting-edge electron and ion microscopy applications, with an emphasis on products for Transmission Electron Microscopes (TEM). The company develops solutions for applications in nanotechnology, materials science, and biology.
Nanometer Pattern Generation System for Direct Write Lithography using a commercial Electron or Ion Beam Microscope.
The company is a leading supplier of factory automation sensors, measuring instruments and digital microscopes.
Keysight Technologies offers a wide range of high-precision atomic force microscopes (AFM) to meet your unique research needs.
Labsphere is world leader in light testing and measurement, and optical coatings. The company?s products include LED, laser and traditional light source light measurement systems; uniform light sources for imaging device calibration; spectroscopy accessories; and high diffuse reflectance materials and coatings for applications in backlit panel displays, computed radiography, and system calibration.
The company develops innovative measurement and control technologies for researchers studying the physical properties of metals and ceramics at very low temperatures. Typical materials that can be measured include nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices.
LDB Corp provides metrology instruments to industrial component and semiconductor companies.
LightForm develops and sells hyperspectral imaging instrumentation to life science researchers.
LASAW analytical instrument - laser actuated surface acoustic wave analysis of thin film materials. Analysis of physical/mechanical properties such as hardness, density, and elasticity of thin film materials down to the meso/nano level thickness.
Manufacturer of laser particle size measurement instruments.
MikroMasch supplies a wide range of AFM probes, calibration gratings and other accessories for scanning probe microscopes.
Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization.
Nano Discovery Inc. is a manufacturer of dynamic light scattering (DLS) instruments. The company develops innovative applications using DLS. DLS has been traditionally used mainly for nanoparticle size characterization. By introducing gold nanoparticle probes, the firm developed a unique technology, NanoDLSay (Nanoparticle-Enabled Dynamic Light Scattering Assay)?, for chemical and biological detection and analysis.
A supplier for a variety of AFM systems, probes, accessories, and related nanoscience tools.
NanoSpective specializes in advanced materials characterization. The company uses cutting edge technology and state of the art equipment to perform nanoscale and macroscopic property evaluation of materials.